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Creators/Authors contains: "Hook, Alexander"

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  1. ; ; (, IEEE)
    Microwave materials characterization can be performed using a number of well-established measurement approaches. One such approach, the short-circuited rectangular waveguide (SC-RWG) filled transmission line approach, is known to have sample placement restrictions related to measurement reliability. This work focuses on this approach as a viable solution for microwave materials characterization of liquid materials and addresses the measurement restrictions within the context of sample length and dielectric properties. It is shown via simulation and measurement that samples of length greater than λg/6 (where λg is the wavelength in the RWG) do not have the reported measurement restrictions, nor do materials with high dielectric permittivity and/or loss factor (of any length). 
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